MISMATCH: A Basis for Semi-Automatic Functional Mixed-Signal Test-Pattern Generation*

نویسندگان

  • Hans Kerkhoff
  • Ronald Tangelder
  • Han Speek
چکیده

This paper describes a tool which assists the designer in the rapid generation offunctional tests for mixed-signal circuits down to the actual testsignals for the tester. The tool is based on manipulating design data, making use of macrobased test libraries and tester resources provided by the test engineer, and computer-based interaction with the designer.

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تاریخ انتشار 2004